Vladimir Dozortsev, Ph.D., Development Manager of Trace Metal Instrumentation for AMS will present “Semiconductor Manufacturing Process Improvements and the Role of Real-Time Copper Wastewater Analysis” on Tuesday, November 10th at 3:30 pm EST during the T8-Monitoring technical session being held at the virtual International Water Conference (IWC) 2020. We look forward to connecting, visit our virtual booth from 8-12 November 2020.